Centre For Advanced Microscopy & Materials Characterization
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Centre For Advanced Microscopy & Materials Characterization
[insert tag line]
CAMMC
Frequently Asked Questions
Check out some of the FAQs for the Centre for Advanced Microscopy & Materials Characterization:
What materials are provided by the core facility?
SEM stubs and conductive tape are provided by the facility.
What is the maximum sample size that can be analyzed?
Samples should be no larger than 7 cm in diameter, and a maximum height of 4 cm.
How do I enter the core facility?
The GLIER building is locked at all times. Upon arrival, please contact the Core Manager to be let into the building.
Can I look at non-conductive samples?
Yes. You can use Low Vacuum Mode, which avoids the need for Carbon Coating.
Do you have a Gold Sputter Coater?
No. We only have a Carbon Evaporator.
What is the resolution of the SEM?
5-10 nm in High Vacuum on conductive samples.
Do my samples need to be prepared before I arrive for SEM?
Samples need to be ready to put into the SEM; however, they can be put on the stubs/sample holders when you arrive. We do not have saws or tools to cut metal, so metal samples need to be the proper size to go in the SEM prior to arriving, and ultrasonically cleaned (if necessary).
What is the maximum topographical height for samples for AFM?
The maximum height is 10 um.
Does the core facility prepare samples for users?
No. Samples should be prepared by the users prior to coming to the facility.
Do I need to book the equipment ahead of time?
Yes, the equipment booking schedule can be very busy. Please schedule appointments for any equipment use at least 24 hours in advance.
Do I need to be trained to use the equipment?
If you want to use the equipment by yourself, you need to be trained by the Core Manager, a certified equipment technician and operator. You can choose to have the technician operate the equipment for you during your session for a higher fee if you do not want to get trained.